Optical Characterization of Thin Solid Films

<p>Introduction and modelling activities.- Optical film characterization topics: An overview.- Universal dispersion model for characterization of optical thin films over wide spectral range.- Predicting optical properties of oxides from ab initio calculations.- Spectrophotometry and spectral ellipsometry.- Optical characterization of thin films by means of spectroscopic imaging spectrophotometry.- Data processing methods for imaging spectrophotometry.- In-situ and ex-situ spectrophotometry in thin film characterization.- Ellipsometric characterization of thin solid films.- Characterization of defective and corrugated coatings.- Optical characterization of thin films exhibiting defects.- Scanning probe microscopy characterization of optical thin films.- Resonant grating waveguide structures.- Absorption and scatter.- Roughness and scatter in optical coatings.- Absorption and fluorescence measurements in optical coatings.- Cavity ring-down technique for optical coating characterization.</p><p></p>