Infrared Ellipsometry on Semiconductor Layer Structures

Phonons, Plasmons, and Polaritons

Gebonden Engels 2004 2004e druk 9783540232490
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The study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spectroscopy. This book offers basic insights into the concepts of phonons, plasmons and polaritons, and the infrared dielectric function of semiconductors in layered structures. It describes how strain, composition, and the state of the atomic order within complex layer structures of multinary alloys can be determined from an infrared ellipsometry examination. Special emphasis is given to free-charge-carrier properties, and magneto-optical effects.

A broad range of experimental examples are described, including multinary alloys of zincblende and wurtzite structure semiconductor materials, and future applications such as organic layer structures and highly correlated electron systems are proposed.

Specificaties

ISBN13:9783540232490
Taal:Engels
Bindwijze:gebonden
Aantal pagina's:196
Uitgever:Springer Berlin Heidelberg
Druk:2004

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Inhoudsopgave

Introduction.- Ellipsometry.- Infrared Model Dielectric Functions.- Polaritons in Semiconductor Layer Structures.- Anisotropic Substrates.- Zinsblende-Structure Materials (III-V).- Wurtzite-Structure Materials (Group-III Nitrides, ZnO).- Magneto-optic Ellipsometry.

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€ 264,99
Levertijd ongeveer 9 werkdagen
Gratis verzonden

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        Infrared Ellipsometry on Semiconductor Layer Structures