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Serie: Frontiers in electronic testing
gebondenEngels9780387294087
30-11-2006
This is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. Meer
gebondenEngels9780387747460
10-12-2007
Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Meer
gebondenEngels9780387257426
7-11-2005
Enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology.
Examines the testing and fault diagnosis of analog and analog part of mixed signal circuits. Meer
gebondenEngels9780387314181
11-8-2006
As many circuits and applications now enter the Gigahertz frequency range, accurate digital timing measurements have become crucial in the design, verification, characterization, and application of electronic circuits. Meer
gebondenEngels9780387249933
21-6-2005
This book grew out of an attempt to describe a variety of tools that were developed over a period of years in IBM to analyze Integrated Circuit fail data. Meer
gebondenEngels9780387307510
20-7-2006
The Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500tm provides insight into the rules and recommendations of IEEE Std. 1500. This book focuses on practical design considerations inherent to the application of IEEE Std. Meer
gebondenEngels9780387310688
14-6-2006
This book reviews fault-tolerance techniques for SRAM-based Field Programmable Gate Arrays (FPGAs), outlining many methods for designing fault tolerance systems. Meer
gebondenEngels9780387465463
21-6-2007
The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield. Meer
gebondenEngels9780792397144
30-4-1996
Over the years there has been a large increase in the functionality available on a single integrated circuit. This has been mainly achieved by a continuous drive towards smaller feature sizes, larger dies, and better packing efficiency. Meer
gebondenEngels9780792399209
31-5-1997
MCMs today consist of complex and dense VLSI devices mounted into packages that allow little physical access to internal nodes. The complexity and cost associated with their test and diagnosis are major obstacles to their use. Meer
gebondenEngels9780792399216
30-6-1997
Reasoning in Boolean Networks provides a detailed treatment of recent research advances in algorithmic techniques for logic synthesis, test generation and formal verification of digital circuits. Meer
gebondenEngels9780792399452
30-6-1997
Testing techniques for VLSI circuits are undergoing many exciting changes. The predominant method for testing digital circuits consists of applying a set of input stimuli to the IC and monitoring the logic levels at primary outputs. Meer
gebondenEngels9780792396581
30-11-1995
Preface Testing Integrated Circuits for manufacturing defects includes four basic disciplines. First of all an understanding of the origin and behaviour of defects. Meer
gebondenEngels9780792381327
30-4-1998
Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. Meer
gebondenEngels9780792382638
30-9-1998
"System level testing is becoming increasingly important. It is driven by the incessant march of complexity . Meer
gebondenEngels9780792382959
31-10-1998
In the early days of digital design, we were concerned with the logical correctness of circuits. We knew that if we slowed down the clock signal sufficiently, the circuit would function correctly. Meer
gebondenEngels9780792386698
30-9-1999
Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Meer
gebondenEngels9780792396734
31-12-1995
Branch-and-bound search has been known for a long time and has been widely used in solving a variety of problems in computer-aided design (CAD) and many important optimization problems. Meer
gebondenEngels9780792381846
30-6-1998
Formal Equivalence Checking and Design Debugging covers two major topics in design verification: logic equivalence checking and design debugging. The first part of the book reviews the design problems that require logic equivalence checking and describes the underlying technologies that are used to solve them. Meer
gebondenEngels9789048132812
7-12-2009
Model based testing is the most powerful technique for testing hardware and software systems. Models in Hardware Testing describes the use of models at all the levels of hardware testing. Meer